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Breaking
the Barrier Toward Nanometer X-ray Resolution
Sunday, September 30, 2007
Possible advances for
nanoscience, energy, biology, and materials research
The
research team at NSLS beamline X13B, from left: James Ablett,
Aaron Stein, and Kenneth Evans-Lutterodt.
Credit:
Brookhaven
National Laboratory
A team of researchers at
the U.S. Department of Energy's Brookhaven National Laboratory
have overcome a major obstacle for using refractive lenses to
focus x-rays. This method will allow the efficient focusing of
x-rays down to extremely small spots and is an important
breakthrough in the development of a new, world-leading light
source facility that promises advances in nanoscience, energy,
biology, and materials research.
At Brookhaven's National
Synchrotron Light Source (NSLS), the scientists exceeded a limit
on the ability to focus "hard," or high-energy, x-rays
known as the "critical angle."
The critical angle is the
maximum angle that light can be deflected, or bent, by a single
surface. Imagine a beam of laser light traveling toward a glass
lens. Depending on the characteristics of the lens material and
the angle at which the beam is pointed, the light can be
refracted, that is, transmitted through the lens but deflected.
However, when this light approaches the lens at angles less than
the critical angle, the beam does not pass through the lens but
is instead reflected. This results in a maximum deflection angle
for light that passes through the lens.
The maximum deflection angle
determines the minimum spot size to which x-rays can be focused.
This poses a problem for researchers who are using x-rays to
study molecules, atoms, and advanced materials at the nanoscale -
on the order of billionths of a meter. Such small subjects
require tightly focused beams.
"One measure of the
quality of an x-ray optic is how small a focused spot it can
make," said NSLS researcher Ken Evans-Lutterodt. "The
problem is that nature does not allow a single lens to deflect
the x-rays very much. This limits how small of a spot you can
create, and this translates to some fuzziness in the image. To
get a sharper image, you need a lens that's more able to deflect
the x-rays."
In 2003, a trio of Brookhaven
researchers - Evans-Lutterodt, Aaron Stein, and James Ablett -
were the first to notice the critical angle limit while
investigating the properties of a so-called kinoform lens for
focusing hard x-rays. This efficient type of refractive lens is
similar to those found in lighthouses. The research team proposed
a solution to the critical angle problem of a compound kinoform
lens, and both the problem and proposed solution were also
suggested later by other researchers in the field.
In the current publication, the
researchers implemented their idea by creating a compound lens
from a series of four kinoform lenses placed one after the other.
Using this setup at NSLS beamline X13B, they showed that the
critical angle can be surpassed with hard x-rays, while still
focusing like a single lens.
"Thanks to the excellent
fabrication resources at Brookhaven's Center for Functional
Nanomaterials and at Alcatel-Lucent, we are able to fabricate the
lenses to the precision required," Stein said.
This is an important step for
the National Synchrotron Light Source II (NSLS-II), a
state-of-the-art synchrotron facility that will produce x-rays up
to 10,000 times brighter than those generated by the current NSLS
and could lead to advances such as alternative-energy
technologies and new drugs for fighting disease. One of the major
goals of the facility is to probe materials and molecules with
just one-nanometer resolution - a capability needed to study the
intricate mechanisms of chemical and biological systems.
"Without exceeding the
critical angle, the refractive lens resolution would be limited
to 24 nanometers or more," Ablett said. "Even though in
this experiment we just barely exceeded this limit, we've shown
that it can be done. This is just the first step."
Next, the researchers will
measure the resolution their new lens system produces, and will
continue to fabricate and test optics that push further beyond
the critical angle, and closer to the one-nanometer benchmark.
"We've broken the barrier,
now there's still more work to be done to get down to those small
x-ray spots," Evans-Lutterodt said. "Hopefully this
will be one of the routes that NSLS-II and others will use."
Natasha Bozovic, from San Jose
State University, also collaborated on this research. Funding was
provided by the Office of Basic Energy Sciences within the U.S.
Department of Energy's Office of Science.
Source:
Brookhaven National Laboratory

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