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| View inside an ion trap, the heart of an ion trap quantum computer. Credit: C Lackner/Quantum Optics and Spectroscopy Group, University of Innsbruck |
Quantum devices are becoming ever more complex and powerful. Researchers at the University of Innsbruck, in collaboration with the Johannes Kepler University Linz and the University of Technology Sydney, are now presenting a method to characterize even large quantum computers using only a single measurement setting.
The gold-standard for the characterization of quantum devices is so-called quantum tomography, which in analogy to medical tomography, can draw a complete picture of a quantum system from a series of snapshots of the system. While offering plenty of insights, the number of measurements required for tomography increases rapidly, with three times as many measurements required for every additional qubit. Due to the sheer time it takes to perform all these measurements, tomography has only been possible on devices with a handful of qubits. However, recent developments on quantum computers have successfully scaled up system sizes much beyond the capabilities of tomography, making their characterization a daunting bottleneck.

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